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Measurement Systems | Film Characterization

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Thin-Films
FR-Basic - Custom build film measurement system (based on modules)
FR-Basic-W
Custom Film Measurement System
THETAMETRISIS
FR-Basic - Custom build film measurement system (based on modules)
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Thin-Films
FR-Education - Film measurement system for educational laboratories
FR-Education-W
Film Measurement Systems
POLOS
FR-Education - Film measurement system for educational laboratories
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thin-films
FR-ES - Characterization of coatings
FR-ES
Film Measurement Systems
POLOS
FR-ES - Characterization of coatings
Compact and light-weighted unit for the characterization of coatings. Perform reflectance and transmittance measurements in the 370 - 1020 nm spectral range.
12 nm - 500 um
370 nm - 1700 nm
Halogen (internal)
Table-top system
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thin-films
FR-Mic - Modular optical column for fast & accurate coating characterization
FR-Mic-200-850
Film Measurement Systems
POLOS
FR-Mic - Modular optical column for fast & accurate coating characterization
4 nm to 60 μm
200 nm - 850 nm
Balanced Deuterium & Halogen (internal) (Not included!)
Table-top system
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Thin-Films
FR-pOrtable - Optical characterization of single or stack of films
FR-pOrtable-W
Film Measurement Systems
POLOS
FR-pOrtable - Optical characterization of single or stack of films
12 nm to 90 μm
380 nm - 1020 nm
20,000 h
Portable system
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thin-films
FR-SCANNER-AIO-MIC-XY200 -Automated & fast mapping of films
FR-SCANNER-AIO-MIC-XY200
Film Measurement Systems
POLOS
FR-SCANNER-AIO-MIC-XY200 -Automated & fast mapping of films
4 nm - 150 μm
200 nm - 1700 nm
2,000 h
Table-top system
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Thin-Films
FR-Scanner - Automatic characterization of single or stack of films
FR-Scanner-W
Film Measurement Systems
POLOS
FR-Scanner - Automatic characterization of single or stack of films
3 nm to 100 um
200 nm - 1020 nm
2,000 h - 5,000 h
Tabletop System
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