Thin Films

Systems for thin films, ranging from CVD and ALD atomic layer
deposition to gas filters and heating elements for diffusion ovens.

All measurement systems

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Thin-Films
FR-Basic - Custom build film measurement system (based on modules)
FR-Basic-W
Custom Film Measurement System
THM
FR-Basic - Custom build film measurement system (based on modules) Thin-Films » Measurement Systems » Custom Film Measurement System
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Thin-Films
FR-Education - Film measurement system for educational laboratories
FR-Education-W
Film Measurement Systems
THM
FR-Education - Film measurement system for educational laboratories Thin-Films » Measurement Systems » Film Measurement Systems
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thin-films
FR-ES - Characterization of coatings
FR-ES
Film Measurement Systems
POLOS
FR-ES - Characterization of coatings thin-films » Measurement Systems » Film Measurement Systems
Compact and light-weighted unit for the characterization of coatings. Perform reflectance and transmittance measurements in the 370 - 1020 nm spectral range.
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thin-films
FR-Mic - Modular optical column for fast & accurate coating characterization
FR-Mic
Film Measurement Systems
POLOS
FR-Mic - Modular optical column for fast & accurate coating characterization thin-films » Measurement Systems » Film Measurement Systems
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Thin-Films
FR-pOrtable - Optical characterization of single or stack of films
FR-pOrtable-W
Film Measurement Systems
THM
FR-pOrtable - Optical characterization of single or stack of films Thin-Films » Measurement Systems » Film Measurement Systems
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Thin-Films
FR-Scanner - Automatic characterization of single or stack of films
FR-Scanner-W
Film Measurement Systems
THM
FR-Scanner - Automatic characterization of single or stack of films Thin-Films » Measurement Systems » Film Measurement Systems
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