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Measurement Systems | Film Characterization
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Thin-Films
FR-Basic-W
Custom Film Measurement System
THETAMETRISIS
Thin-Films
FR-Education-W
Film Measurement Systems
POLOS
thin-films
FR-ES
Film Measurement Systems
POLOS
Compact and light-weighted unit for the characterization of coatings. Perform reflectance and transmittance measurements in the 370 - 1020 nm spectral range.
12 nm - 500 um
370 nm - 1700 nm
Halogen (internal)
Table-top system
thin-films
FR-Mic-200-850
Film Measurement Systems
POLOS
4 nm to 60 μm
200 nm - 850 nm
Balanced Deuterium & Halogen (internal) (Not included!)
Table-top system
Thin-Films
FR-pOrtable-W
Film Measurement Systems
POLOS
12 nm to 90 μm
380 nm - 1020 nm
20,000 h
Portable system
thin-films
FR-SCANNER-AIO-MIC-XY200
Film Measurement Systems
POLOS
4 nm - 150 μm
200 nm - 1700 nm
2,000 h
Table-top system
Thin-Films
FR-Scanner-W
Film Measurement Systems
POLOS
3 nm to 100 um
200 nm - 1020 nm
2,000 h - 5,000 h
Tabletop System