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Film Measurement Systems
(8)Custom Film Measurement System
(1)Film Measurement Systems
Non-destructive real-time characterization of thin film layers and coatings with thickness in the 1nm-500um range. FR-tools provide reflectance, absorbance and transmittance measurements at the workfloor. With FR-tools the thickness, optical constants (n & k), uniformity, colour of suspended and supported stacks are measured with high accuracy in static and dynamic conditions.
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Measurement Systems
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Category
Film Measurement Systems
(8)Custom Film Measurement System
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Thin-Films
FR-Education-W
Film Measurement Systems
POLOS
thin-films
FR-ES
Film Measurement Systems
POLOS
Compact and light-weighted unit for the characterization of coatings. Perform reflectance and transmittance measurements in the 370 - 1020 nm spectral range.
thin-films
FR-Mic-200-850
Film Measurement Systems
POLOS
thin-films
FR-SCANNER-AIO-MIC-XY200
Film Measurement Systems
POLOS
thin-films
FR-SCANNER-AIO-MIC-XY300
Film Measurement Systems
POLOS
Thin-Films
FR-Scanner-W
Film Measurement Systems
POLOS
