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Film Measurement Systems
(6)
Custom Film Measurement System
(1)
Thickness range
12 nm - 500 um
12 nm to 90 μm
3 nm to 100 um
4 nm - 150 μm
4 nm to 60 μm
Spectral range
200 nm - 1020 nm
200 nm - 1700 nm
200 nm - 850 nm
370 nm - 1700 nm
380 nm - 1020 nm
Light Source MTBF
2,000 h
2,000 h - 5,000 h
20,000 h
Balanced Deuterium & Halogen (internal) (Not included!)
Halogen (internal)
System type
Portable system
Table-top system
Tabletop System

Film Measurement Systems

Non-destructive real-time characterization of thin film layers and coatings with thickness in the 1nm-500um range. FR-tools provide reflectance, absorbance and transmittance measurements at the workfloor. With FR-tools the thickness, optical constants (n & k), uniformity, colour of suspended and supported stacks are measured with high accuracy in static and dynamic conditions.

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Thin-Films
FR-Education - Film measurement system for educational laboratories
FR-Education-W
Film Measurement Systems
POLOS
FR-Education - Film measurement system for educational laboratories
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thin-films
FR-ES - Characterization of coatings
FR-ES
Film Measurement Systems
POLOS
FR-ES - Characterization of coatings
Compact and light-weighted unit for the characterization of coatings. Perform reflectance and transmittance measurements in the 370 - 1020 nm spectral range.
12 nm - 500 um
370 nm - 1700 nm
Halogen (internal)
Table-top system
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thin-films
FR-Mic - Modular optical column for fast & accurate coating characterization
FR-Mic-200-850
Film Measurement Systems
POLOS
FR-Mic - Modular optical column for fast & accurate coating characterization
4 nm to 60 μm
200 nm - 850 nm
Balanced Deuterium & Halogen (internal) (Not included!)
Table-top system
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Thin-Films
FR-pOrtable - Optical characterization of single or stack of films
FR-pOrtable-W
Film Measurement Systems
POLOS
FR-pOrtable - Optical characterization of single or stack of films
12 nm to 90 μm
380 nm - 1020 nm
20,000 h
Portable system
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thin-films
FR-SCANNER-AIO-MIC-XY200 -Automated & fast mapping of films
FR-SCANNER-AIO-MIC-XY200
Film Measurement Systems
POLOS
FR-SCANNER-AIO-MIC-XY200 -Automated & fast mapping of films
4 nm - 150 μm
200 nm - 1700 nm
2,000 h
Table-top system
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Thin-Films
FR-Scanner - Automatic characterization of single or stack of films
FR-Scanner-W
Film Measurement Systems
POLOS
FR-Scanner - Automatic characterization of single or stack of films
3 nm to 100 um
200 nm - 1020 nm
2,000 h - 5,000 h
Tabletop System
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