Probe card cleaning film

In the wafer inspection process of semiconductor front-end processing, it is important to maintain the cleanliness and shape of dedicated testers at a constant level in order to reduce the risk of defective wafers. In the worst case, the accuracy of the wafer inspection process can deteriorate to the point where wafer inspection must be interrupted or the dedicated tester replaced for an extended period of time. Our cleaning sheets are effective in cleaning and shaping these dedicated testers.