WHS

Vacuum Tip PEEK 76-150 mm

Vacuum Tip PEEK 76-150 mm
WHS

Vacuum Tip PEEK 76-150 mm

Choose your size:
SEMI Standard Wafer Handling
Antistatic PEEK Material
Straight or bend

Antistatic conductive PEEK vacuum wand tip for general handling of substrates in a cleanroom environment. Features 3° offset vacuum pocket with straight-profile bend-profiles with 10° or 30° available, press-fit type installation. For handling of 50 mm up to 300 mm silicon, glass, thin, and compound wafer substrates. ISO Class 3.

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