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Aluminium Test Wafers
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Mock Wafers | Test Wafer

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wafer-handling
Aluminum Test Wafer, 300 mm (12”), Bare, with SEMI Notch.
WHS-W-1201
Aluminium Test Wafers
Wafer handling products
Aluminum Test Wafer, 300 mm (12”), Bare, with SEMI Notch.
For use in robot training, wafer handling training, carrier wafer, and for use as an electrostatic chuck cover in chamber cleaning.
300 mm (12”)
5754-H22 aluminum
0.8 mm
1.6µm Ra
Chem-cleaned surface
ISO 3 (Class 1 FS209E)
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wafer-handling
Aluminum test wafer bare, with SEMI flat (WHS-W) 100 mm (4")
WHS-W-402
Aluminium Test Wafers
Wafer handling products
Aluminum test wafer bare, with SEMI flat (WHS-W) 100 mm (4")
100 mm (4")
5754-H22 aluminum
0.8 mm
1.6µm Ra
Chem-cleaned surface
ISO 3 (Class 1 FS209E)
View product
wafer-handling
Aluminum Test Wafer, 150 mm (6”), Bare, with SEMI Notch.
WHS-W-601
Aluminium Test Wafers
Wafer handling products
Aluminum Test Wafer, 150 mm (6”), Bare, with SEMI Notch.
For use in robot training, wafer handling training, carrier wafer, and for use as an electrostatic chuck cover in chamber cleaning.
150 mm (6”)
5754-H22 aluminum
0.8 mm
1.6µm Ra
Chem-cleaned surface
ISO 3 (Class 1 FS209E)
View product
wafer-handling
Aluminum Test Wafer, 200 mm (8”), Bare, with SEMI Notch.
WHS-W-801
Aluminium Test Wafers
Wafer handling products
Aluminum Test Wafer, 200 mm (8”), Bare, with SEMI Notch.
For use in robot training, wafer handling training, carrier wafer, and for use as an electrostatic chuck cover in chamber cleaning.
200 mm (8”)
5754-H22 aluminum
0.8 mm
1.6µm Ra
Chem-cleaned surface
ISO 3 (Class 1 FS209E)
View product