THETAMETRISIS

ThetaMetrisis is a privately held company established in December 2008 in Athens, Greece as the first spin-off company of the Institute of Microelectronics, NCSR 'Demokritos'.

ThetaMetrisis's core technology is White Light Reflectance Spectroscopy (WLRS) that allows accurate and simultaneous measurement of thickness and refractive index of stacked thin and thick films in ultra-wide range from few Angstroms to millimeters.

Main activities:

• FR-pRO - Film Characterization
• FR-pOrtable - Characterization of coatings at the Point-of-Need
• FR-ES - Characterization of coatings
• FR-µProbe - For applications that require spot size as small as very few microns
• FR-Scanner - For automatic characterization of films and coatings
• FR-Mic - For modular optical column for fast & accurate coating characterization applications that require spot size as small as few micrometers