Aluminum Test Wafer, 100 mm (4”), Bare, with SEMI Notch.

Aluminum Test Wafer, 100 mm (4”), Bare, with SEMI Notch.

Number: WHS-W-401
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Specifications

Number
WHS-W-401
Size
100 mm (4”)
Option
with SEMI notch
Thick
0.8 mm
Material
Bare Aluminum T6061 (T7071-TS)
Brand

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Product description

Applications:

  • Training: Aluminum test wafers are used to train new operators on wafer handling techniques, allowing them to practice and develop their skills before handling more expensive and fragile production wafers.
  • Automation Teach: Aluminum wafers are often used to teach robotic movements in automation, allowing engineers to test and refine robotic movements using durable aluminum wafers before moving on to more fragile and expensive silicon wafers.
  • Protection: Aluminum wafers can be used as protective electrostatic chuck (PEC) wafers to cover fragile wafer chucks inside a process tool chamber when the tool is undergoing a chamber cleaning cycle, preventing damage to the sensitive chucks during the cleaning process.

The WHS-W-401 is a 100 mm aluminum test wafer, with flat, bare no finish coating, 100 mm (+/-0.1 mm) x 0.8 mm thick, aluminum has been heat treated to make the crystalline structure more resistant to deformation and warping. For use in robot training, wafer handling training, carrier wafer, and for use as an electrostatic chuck cover in chamber cleaning.